Siemens Tessent IJTAG Pro Accelerates 3D IC Testing with High-Bandwidth IJTAG
On this page
Siemens Tessent IJTAG Pro Accelerates 3D IC Testing with High-Bandwidth IJTAG
Siemens Digital Industries Software launches Tessent IJTAG Pro, transforming IEEE1687-based IJTAG I/O from serial to parallel.
Detail
This high-bandwidth IJTAG leverages the Tessent SSN wide-bus architecture to speed up test vector transfer and cut ATE costs.
As transistor density and multi-die designs grow, test vector counts and ATE costs surge. Tessent IJTAG Pro helps AI chip designers and test engineers shorten test cycles and maintain competitive edge.
Early adopters report much faster vector transfer and reduced test application time. Combine with Tessent AnalogTest for expanded analog and bandwidth testing capabilities.
Keywords: Tessent IJTAG Pro, IJTAG, IEEE1687, SSN, Tessent, 3D IC, chiplet, BIST, ATE cost, semiconductor test.
Call to action: Evaluate Tessent IJTAG Pro to accelerate your complex IC testing and reduce costs today.
Sourcing help
Send the BOM for one quote covering active stock, EOL stock and cross-references.
Need a quote for this part?
Send us the part number or article link — we will confirm price, availability and lead time.